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Goal: The Test Working Group of the ITRS works to forecast the needs of the test community for the next 15 years. Edit

  1. Contributors
  2. Executive Summary
  3. Drivers, Challenges and Future Opportunities
  4. Test and Yield Leaning
  5. Cost of Test
  6. Three Dimensional Device Testing
  7. Adaptive Testing
  8. Test Technology Requirements
    1. SOC and SIC Test Challenges
    2. Logic Device Test Challenges
    3. High-Speed Input/Output Device Testing Challenge
    4. Memory Device Testing
    5. Analog and Mixed-Signal Testing
    6. RF Device Testing
    7. Reliability Screening
    8. Mechanical Handling Requirements
      1. Probers
      2. Device Handlers
    9. Device Interface Requirements
      1. Probe Cards
      2. Sockets
    10. Specialty Device Testing