Goal: The Test Working Group of the ITRS works to forecast the needs of the test community for the next 15 years.[]
- Contributors
- Executive Summary
- Drivers, Challenges and Future Opportunities
- Test and Yield Leaning
- Cost of Test
- Three Dimensional Device Testing
- Adaptive Testing
- Test Technology Requirements
- SOC and SIC Test Challenges
- Logic Device Test Challenges
- High-Speed Input/Output Device Testing Challenge
- Memory Device Testing
- Analog and Mixed-Signal Testing
- RF Device Testing
- Reliability Screening
- Mechanical Handling Requirements
- Probers
- Device Handlers
- Device Interface Requirements
- Probe Cards
- Sockets
- Specialty Device Testing